Yttria-Stabilized Zirconia (YSZ) Single Crystal Wafers

Yttria-Stabilized Zirconia (YSZ) Single Crystal Wafers

Physical Properties:
Crystal Structure: Cubic System
Lattice Constant: a=5.125 Angstrom
Composition Ratio: Y2O3:ZrO2 = 8:92 mol%
Density: 5.8 g/cm^3
Melting Point: 2800 degC
Growth Method: Skull Melting

Standard Specifications:
Orientation: (100) miscut < 0.3 deg (Available < 0.1 deg)
Orientation: (110) miscut < 0.3 deg (Available < 0.1 deg)
Orientation: (111) miscut < 0.3 deg (Available < 0.1 deg)
Edge Orientation: Available
Surface Roughness: Ra: < 0.5 nm