Sapphire (Al2O3) Wafers, C-plane (0001), 0.11″ ＜ Dia. ≤ 1″

Sapphire (Al2O3) C-Plane Wafers, Small Diameter (Dia. 3 mm – 1″)

Overview: High-purity single-crystal sapphire (Al2O3) wafers, C-plane (0001) orientation, in small diameters from Dia. 3 mm up to 1 inch. Available in single-side polished (SSP) and double-side polished (DSP) options. These substrates deliver exceptional hardness, optical transparency (UV to IR), thermal stability, and chemical inertness, making them ideal for a wide range of research applications.

Key Specifications:
– Orientation: C-plane (0001)
– Diameter: Dia. 3 mm to Dia. 25.4 mm (1 inch)
– Thickness: 0.5 mm – 2.0 mm (varies by diameter)
– Polish: SSP (single-side polished) or DSP (double-side polished)
– Purity: 99.999%+ single-crystal Al2O3
– Crystal Grade: Optical/research grade
– Surface Roughness: <0.5 nm Ra (polished face)

Material Properties:
– Hardness: 9 Mohs (second hardest natural material)
– Melting Point: 2,040°C
– Optical Transmission: 0.15 – 5.5 μm (UV to mid-IR)
– Thermal Conductivity: ~46 W/(m·K) at RT
– Dielectric Constant: ~9.3 – 11.5

Applications:
– Optical windows and viewport substrates (UV, visible, IR)
– Thin-film oxide research (ZnO, NiO, TiO2 on sapphire)
– Power electronics and semiconductor device research
– High-temperature substrate for CVD and PVD processes
– Substrate for GaN and other III-nitride research
– Ultrahard substrate for wear-resistant coatings

Notes:
– Contact us for specific sizes, thickness, and polish options within this range
– For larger diameters (1″–12″), see Al2O3-1-2